George Edward Alcorn Jr.
(born March 22, 1940)
Inventions
One of Alcorn's best-known inventions is the X-ray spectrometer, which earned him the NASA–Goddard Space Flight Center award for Inventor of the Year in 1984.[2]
Other significant inventions concerned plasma etching for semiconductor devices. In 1999, Alcorn was honored with an award from Government Executive magazine for developing the Airborne LIDAR Topographic Mapping System (ALTMS) in partnership with the Houston Advanced Research Center.[2]
In 2015, Alcorn was inducted into the National Inventors Hall of Fame for his invention of the X-ray spectrometer.[4]
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