Who invented the X-Ray Spectrometer? Answer: George Edward Alcorn Jr.

 

George Edward Alcorn Jr.

 Born March 22, 1940

 

X-Ray Spectrometer

US Patent No. 4,472,728

Inducted in 2015

 

 Used with space telescopes and other satellites, x-ray imaging spectrometers provide highly useful data for a wide range of scientific and technical applications. 

 

With improvements that addressed structural and performance deficiencies, Alcorn's devices and their descendants have been used to conduct planetary mapping, search for new planets, create star charts to reveal motions of systems, and examine deep space phenomena.